Design of Trench MIS Field Plate Structure for Edge Termination of GaN…
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ISSN
| 2072-666X |
vol.
23(7)
pp.
2005-2016
- 이전글Security Problems of Latest FPGAs and Reverse Engineering Methods of Xilinx 7-series FPGAs 24.08.01
- 다음글Fluorine-Based Low-Damage Selective Etching Process for E-Mode p-GaN/AlGaN/GaN HFET Fabrication 24.08.01
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