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실무형 Tera-Hz 통신 반도체 기술개발 전문인력 양성

SCI(E) 논문 실적

실무형 Tera-Hz 통신 반도체 기술개발 전문인력 양성
Total 114건 3 페이지
SCI(E) 논문 실적 목록
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학술지명
논문명
DOI
출판일
비고
84 IEEE Access How Does a Transformer Learn Compression? An Attention Study on Huffman and LZ4 10.1109/ACCESS.2023.3341512 20231212
83 Bioinformatics Reducing cost in DNA-based data storage by sequence analysis-aided soft information decoding of variable-length reads 10.1093/bioinformatics/btad548 20230905
82 IEEE Access PyNET-QxQ: An Efficient PyNET Variant for QxQ Bayer Pattern Demosaicing in CMOS Image Sensors 10.1109/ACCESS.2023.3272665 20230503
81 IEEE Access Generative Adversarial Networks for DNA Storage Channel Simulator 10.1109/ACCESS.2023.3235201 20230109
80 Photonics Theoretical Study on Dual-Function Optical Phased Array of LiDAR and Optical Wireless Communication Based on Optically Injection-Locked Semiconductor Lasers 10.3390/photonics10050498 20230426
79 Electronics A fast-lock variable-gain TDC-based N/M-ratio MDLL clock multiplier 10.3390/electronics12194136 20231004
78 Electronics Low-Profile High-Efficiency Transmitarray Antenna for Beamforming Applications 10.3390/electronics12143178 20230721
77 IEEE Access A Dual-Polarized Reconfigurable Reflectarray Antenna Based on a Symmetrically Rotated Sub-Array 10.1109/ACCESS.2023.3280855 20230529
76 Microwave and Optical Technology Letters Elimination of Interference and Cross Talk from a Face-to-Face-Antennas System by a Metasurface Absorber 10.1002/mop.33740 20230427
75 Materials Broadband Metasurface Absorber Based on an Optimal Combination of Copper Tiles and Chip Resistors 10.3390/ma16072692 20230328
74 micromachines Investigation of the Gate Degradation Induced by Forward Gate Voltage Stress in p-GaN Gate High Electron Mobility Transistors 10.3390/mi14050977 20230429
73 JSTS Security Problems of Latest FPGAs and Reverse Engineering Methods of Xilinx 7-series FPGAs 10.5573/JSTS.2023.23.5.283 20231031
72 Micromachines Design of Trench MIS Field Plate Structure for Edge Termination of GaN Vertical PN Diode 10.3390/mi14112005 20231028
71 Electronics Fluorine-Based Low-Damage Selective Etching Process for E-Mode p-GaN/AlGaN/GaN HFET Fabrication 10.3390/electronics12204347 20231020
70 Electronics Recess-Free E-Mode AlGaN/GaN MIS-HFET with Crystalline PEALD AlN Passivation Process 10.3390/electronics12071667 20230331

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